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Focused ion beam
Results: 158

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91	PHiTEM Platform for High Temperature Materials Scope of project With the establishing of the platform of high temperature materials and multi-scale characterisation of micro-structure and mechanical behaviour of these ma Add to Reading List Source URL: www.ccem.ch Language: English - Date: 2014-03-17 10:46:22 Physics Hardness tests Focused ion beam Scanning electron microscope Transmission electron microscopy Electron microscope Contact mechanics Hardness Yield Scientific method Electron microscopy Science
92	Microsoft PowerPoint - Limitations-Potential-SEM-Iolo_printout.ppt Add to Reading List Source URL: www.ecmjournal.org Language: English - Date: 2012-06-13 09:22:31 Scanning electron microscope Environmental scanning electron microscope Electron microscope Microscope Electron Secondary electrons Microscopy Optical microscope Focused ion beam Scientific method Electron microscopy Science
93 $Optics / X-ray microscope / Diffraction / Extreme ultraviolet lithography / X-ray / Electron / Diffraction topography / Physics / Electromagnetic radiation / Microscopes$	Efficient focusing of 8 keV X-rays with multilayer Fresnel zone plates fabricated by atomic layer deposition and focused ion beam milling Add to Reading List Source URL: journals.iucr.org Language: English - Date: 2014-04-23 12:28:22 Optics X-ray microscope Diffraction Extreme ultraviolet lithography X-ray Electron Diffraction topography Physics Electromagnetic radiation Microscopes
94	Fraunhofer Institute for Reliability and M i c r o i n t e g r at i o n I Z M Focused Ion Beam • Design parameter effect analysis (geometry, material, load profile) Add to Reading List Source URL: www.izm.fraunhofer.de Language: English - Date: 2015-02-12 09:57:08 Reliability Measuring instrument Thermomechanical analysis Failure analysis Electron microscope Dynamic mechanical analysis Atomic force microscopy Characterization MIL-STD-883 Science Materials science Scientific method
95	Plasma-FIB (Focused Ion Beam) The C2MI plasma-FIB is mainly used to perform micro crosssections on samples by using an ion source. The ion source is focused on the sample to obtain a small beam that can etch the surface Add to Reading List Source URL: www.c2mi.ca Language: English - Date: 2014-11-24 15:51:29 Semiconductor device fabrication Electron microscopy Thin film deposition Ions Focused ion beam Ion beam Ion source Fib Scanning electron microscope Chemistry Scientific method Physics
96 $Chemistry / Electron microscope / Scanning electron microscope / Ion beam / Optical microscope / Microscope / Ion milling machine / Electron backscatter diffraction / Focused ion beam / Scientific method / Electron microscopy / Science$	Ion Milling: Improving sample preparation The C2MI ion milling tool is mainly used as the final preparation step for metallographic cut (cross-section[removed]mm wide argon ion beam is used mechanically to etch the sample Add to Reading List Source URL: www.c2mi.ca Language: English - Date: 2014-11-24 15:47:45 Chemistry Electron microscope Scanning electron microscope Ion beam Optical microscope Microscope Ion milling machine Electron backscatter diffraction Focused ion beam Scientific method Electron microscopy Science
97	PhD Candidate Position at the Laboratory for Electron Microscopy, Karlsruhe Institute of Technology (Karlsruhe, Germany) Nanotechnology requires imaging techniques with nanometer spatial resolution which yield quantitati Add to Reading List Source URL: www.lem.kit.edu Language: English - Date: 2014-07-03 04:32:24 Physics Electron microscope Transmission electron microscopy Microscope Scanning transmission electron microscopy Microscopy Focused ion beam Scanning electron microscope Electron Electron microscopy Scientific method Science
98	Supplementary Material for “Characterization and reduction of microfabrication-induced decoherence in superconducting quantum circuits” C. M. Quintana,1 A. Megrant,1 Z. Chen,1 A. Dunsworth,1 B. Chiaro,1 R. Barends,1 Add to Reading List Source URL: web.physics.ucsb.edu Language: English - Date: 2014-08-14 14:18:10 Semiconductor device fabrication Science Thin film deposition Physics Electromagnetism Electron beam lithography Focused ion beam Resonator Electron microscope Materials science Microtechnology Electron microscopy
99 $Semiconductor device fabrication / Thin film deposition / Electron beam / Focused ion beam / Failure analysis / Electron beam induced current / Electron microscope / Scanning electron microscope / Electron backscatter diffraction / Scientific method / Science / Electron microscopy$	FRAUNHOFER CAM IS A COMPETENCE CENTER FOR MICROSTRUCTURE DIAGNOSTICS A N D M AT E R I A L C H A R A C T E R I Z AT I O N WITHIN FRAUNHOFER IWM IN HALLE FRAUNHOFER CENTER Add to Reading List Source URL: www.iwm.fraunhofer.de Language: English - Date: 2014-05-20 04:29:23 Semiconductor device fabrication Thin film deposition Electron beam Focused ion beam Failure analysis Electron beam induced current Electron microscope Scanning electron microscope Electron backscatter diffraction Scientific method Science Electron microscopy
100	F R A U N H O F E R I N S T I T U T E F O R M E C H A N I C S O F M AT E R I A L S I W M COMPONENTS IN MICROELECTRONICS AND MICROSYSTEMS TECHNOLOGY Your competent partner for Add to Reading List Source URL: www.en.iwm.fraunhofer.de Language: English - Date: 2011-11-18 03:55:18 Technology Electron microscopy Failure Thin film deposition Microtechnology Microelectromechanical systems Failure analysis Wafer bonding Focused ion beam Science Semiconductor device fabrication Scientific method

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